Titlebook: VLSI Design and Test; 17th International S Manoj Singh Gaur,Mark Zwolinski,Adit D. Sing Conference proceedings 2013 Springer-Verlag Berlin

愚蠢地活

書(shū)目名稱VLSI Design and Test影響因子(影響力)




書(shū)目名稱VLSI Design and Test影響因子(影響力)學(xué)科排名




書(shū)目名稱VLSI Design and Test網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱VLSI Design and Test網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱VLSI Design and Test被引頻次




書(shū)目名稱VLSI Design and Test被引頻次學(xué)科排名




書(shū)目名稱VLSI Design and Test年度引用




書(shū)目名稱VLSI Design and Test年度引用學(xué)科排名




書(shū)目名稱VLSI Design and Test讀者反饋




書(shū)目名稱VLSI Design and Test讀者反饋學(xué)科排名

IDEAS

engrave

oracle

Impact of Fin Width and Graded Channel Doping on the Performance of 22nm SOI FinFET,fin width to be scaled beyond 10nm. Stability of the fins patterned beyond 10nm width is to be viewed with suspected eyes. It is observed that Graded doping of the channel will improve threshold voltage and hence the ratio of I. to ..will also increase, which is desired for enhanced performance in analog applications.

單色

1865-0929 ubmissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.978-3-642-42023-8978-3-642-42024-5Series ISSN 1865-0929 Series E-ISSN 1865-0937

敘述

A Novel Design Methodology for High Tuning Linearity and Wide Tuning Range Ring Voltage Controlled uration region during switching and consequently enhances the tuning range without additional circuitry. The design is implemented in UMC 0.18 .m CMOS technology at 1.8 V supply voltage. The overall circuit consumes 260 .W power at 404.5 MHz, has a wide tuning range of 66 MHz to 875 MHz having 94.5% tuning linearity.

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FACT

Mercantile

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