書目名稱 | Ultimate Limits of Fabrication and Measurement | 編輯 | M. E. Welland,J. K. Gimzewski | 視頻video | http://file.papertrans.cn/941/940381/940381.mp4 | 叢書名稱 | NATO Science Series E: | 圖書封面 |  | 描述 | An extensive body of research is involved in pushingminiaturisation to its physical limit, encompassing theminiaturisation of electronic devices, the manipulation of singleatoms by scanning tunnelling microscopy, bio-engineering, the chemicalsynthesis of complex molecules, microsensor technology, andinformation storage and retrieval. In parallel to these practicalaspects of miniaturisation there is also the necessity to understandthe physics of small structures. ..Ultimate Limits of Fabrication and Measurement. brings together anumber of leading articles from a variety of fields with the commonaim of ultimate miniaturisation and measurement. . | 出版日期 | Book 1995 | 關(guān)鍵詞 | AES; Laser; PAS; REM; STEM; STM; Sensor | 版次 | 1 | doi | https://doi.org/10.1007/978-94-011-0041-0 | isbn_softcover | 978-94-010-4023-5 | isbn_ebook | 978-94-011-0041-0Series ISSN 0168-132X | issn_series | 0168-132X | copyright | Springer Science+Business Media Dordrecht 1995 |
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