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Titlebook: UNIX-Systemadministration; Linux, Solaris, AIX, Konrad Heuer,Reinhard Sippel Book 2004 Springer-Verlag Berlin Heidelberg 2004 AIX.Administr

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51#
發(fā)表于 2025-3-30 10:44:24 | 只看該作者
Dateien Und Dateisysteme,lagen. Im ganz allgemeinen Sinn umfasst der Begriff Daten zun?chst die den Anwender insbesondere interessierenden Nutzdaten, dann Maschineninstruktionen in Form von Programmen und letztlich Hilfsdaten zur Verwaltung der gesamten Datenablage.
52#
發(fā)表于 2025-3-30 13:14:21 | 只看該作者
53#
發(fā)表于 2025-3-30 16:46:30 | 只看該作者
54#
發(fā)表于 2025-3-30 22:11:02 | 只看該作者
55#
發(fā)表于 2025-3-31 04:25:35 | 只看該作者
56#
發(fā)表于 2025-3-31 06:58:11 | 只看該作者
Konrad Heuer,Reinhard Sippele size incompatibility can be varied, from about - 20 to + 20 percent, almost all the structures a physisorbed monolayer of atoms can assume are encountered, including the two simplest: corrugation-independent and lattice gas type monolayer. These two cases are discussed in some detail, and suggesti
57#
發(fā)表于 2025-3-31 12:38:44 | 只看該作者
58#
發(fā)表于 2025-3-31 15:32:20 | 只看該作者
Konrad Heuer,Reinhard Sippel‘intended to be an advanced case- study text, not a "review" in the standard sense. Each chapter develops principles and illustrates the use of experimental methods. Consequently, more attention is given to experimentation than normally found in journal articles or review articles. My intent in orga
59#
發(fā)表于 2025-3-31 20:12:19 | 只看該作者
Konrad Heuer,Reinhard Sippels are distributed in the area with seismic intensity less than the JMA scale 5+. From the characteristics of the surface fault ruptures, we conclude that the ruptures were triggered by normal faulting with right-lateral slip during the mainshock, but not simple lateral spreading caused by shaking.
60#
發(fā)表于 2025-3-31 23:11:13 | 只看該作者
Konrad Heuer,Reinhard Sippeling tunneling microscopy, atomic force microscopy). Most microscopy techniques used in surface science ensure resolution on the nm scale, while field ion microscopy, scanning tunneling microscopy and atomic force microscopy allow acquisition of images with atomic resolution.
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