書目名稱 | Transmission Electron Microscopy |
副標(biāo)題 | Physics of Image For |
編輯 | Helmut Kohl,Ludwig Reimer |
視頻video | http://file.papertrans.cn/929/928987/928987.mp4 |
概述 | Standard reference book.Now updated by the successor of the original author.New topics of the field included.Gives a comprehensive review of recent progresses in TEM |
叢書名稱 | Springer Series in Optical Sciences |
圖書封面 |  |
描述 | The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book i |
出版日期 | Book 2008Latest edition |
關(guān)鍵詞 | Transmission; X-ray microanalysis; aberration correction; electrion diffraction; electron energy-loss sp |
版次 | 5 |
doi | https://doi.org/10.1007/978-0-387-40093-8 |
isbn_softcover | 978-1-4419-2308-0 |
isbn_ebook | 978-0-387-34758-5Series ISSN 0342-4111 Series E-ISSN 1556-1534 |
issn_series | 0342-4111 |
copyright | Springer-Verlag New York 2008 |