| 書目名稱 | Trace-Based Post-Silicon Validation for VLSI Circuits |
| 編輯 | Xiao Liu,Qiang Xu |
| 視頻video | http://file.papertrans.cn/928/927322/927322.mp4 |
| 概述 | Provides a comprehensive summary of state-of-the-art on post-silicon validation.Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selecti |
| 叢書名稱 | Lecture Notes in Electrical Engineering |
| 圖書封面 |  |
| 描述 | This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.? The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.? A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. |
| 出版日期 | Book 2014 |
| 關(guān)鍵詞 | Correctness of VLSI Circuits; Design for Debug; Functional Error Detection; Post-silicon Validation; Rea |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-00533-1 |
| isbn_softcover | 978-3-319-37594-6 |
| isbn_ebook | 978-3-319-00533-1Series ISSN 1876-1100 Series E-ISSN 1876-1119 |
| issn_series | 1876-1100 |
| copyright | Springer International Publishing Switzerland 2014 |
|Archiver|手機版|小黑屋|
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