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Titlebook: Statistical Quality Technologies; Theory and Practice Yuhlong Lio,Hon Keung Tony Ng,Ding-Geng Chen Book 2019 Springer Nature Switzerland AG

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發(fā)表于 2025-3-25 07:15:47 | 只看該作者
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發(fā)表于 2025-3-25 11:09:50 | 只看該作者
The Stress-Strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Famistrength is larger than the stress. This chapter considers the stress-strength model when both the stress and the strength variables follow the two-parameter proportional hazards family or the proportional reverse hazards family. These two distribution families include many commonly-used distributio
23#
發(fā)表于 2025-3-25 11:59:25 | 只看該作者
A Degradation Model Based on the Wiener Process Assuming Non-Normal Distributed Measurement Errorstead, degradation data analysis that investigates degradation processes of products becomes a useful tool in evaluating reliability. It focuses on the inherent randomness of products, and investigates the lifetime properties by developing degradation models and extrapolating to lifetime variables. B
24#
發(fā)表于 2025-3-25 16:29:14 | 只看該作者
An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Ce testing period even under the accelerated stress condition. Therefore, a test plan must be carefully designed to maximize its statistical efficiency. This chapter presents an approach to optimal test planning based on the proportional hazard model of accelerated life test data. It is shown that th
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發(fā)表于 2025-3-25 23:01:05 | 只看該作者
26#
發(fā)表于 2025-3-26 00:57:25 | 只看該作者
Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturings are unavoidable and affect not only manufacturing yield but also device reliability. In this reason, accurate modeling of the spatial defects distribution is imperatively important for yield and reliability estimation as well as process improvement. Defects on semiconductor wafers tend to cluster,
27#
發(fā)表于 2025-3-26 06:14:30 | 只看該作者
An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I C. This chapter presents an approach to optimal test planning based on the proportional hazard model of accelerated life test data. It is shown that this approach can accommodate multiple stress factors and is applicable to any failure time distribution.
28#
發(fā)表于 2025-3-26 08:45:29 | 只看該作者
Enhanced Cumulative Sum Charts Based on Ranked Set Samplingharts. Results show that the application of RSS technique has significantly improved upon the standard CUSUM chart. Using real RSS data set, we present a practical example of the implementation of the CUSUM schemes.
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發(fā)表于 2025-3-26 16:23:52 | 只看該作者
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發(fā)表于 2025-3-26 20:35:10 | 只看該作者
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