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Titlebook: Software Reliability Growth Models; David D. Hanagal,Nileema N. Bhalerao Book 2021 The Editor(s) (if applicable) and The Author(s), under

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發(fā)表于 2025-3-21 17:13:25 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱Software Reliability Growth Models
編輯David D. Hanagal,Nileema N. Bhalerao
視頻videohttp://file.papertrans.cn/872/871015/871015.mp4
概述Discusses the basic concepts of software reliability growth models.Explains different non-homogeneous Poisson process of software reliability models.Presents applications in artificial neural networks
叢書(shū)名稱Infosys Science Foundation Series
圖書(shū)封面Titlebook: Software Reliability Growth Models; David D. Hanagal,Nileema N. Bhalerao Book 2021 The Editor(s) (if applicable) and The Author(s), under
描述This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon..??.Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering..
出版日期Book 2021
關(guān)鍵詞hazard rate; mean value function; imperfect debugging; non-homogeneous Poisson process; model selection
版次1
doihttps://doi.org/10.1007/978-981-16-0025-8
isbn_softcover978-981-16-0027-2
isbn_ebook978-981-16-0025-8Series ISSN 2363-6149 Series E-ISSN 2363-6157
issn_series 2363-6149
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor
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NHPP Software Reliability Growth Models,This chapter discusses reliability models for the software failure phenomenon based on a non-homogeneous Poisson process (NHPP). Few among the many existing models based on NHPP are discussed, also numerical examples are included to illustrate the results.
地板
發(fā)表于 2025-3-22 07:53:11 | 只看該作者
Generalized Inverse Weibull Software Reliability Growth Model,In this chapter, we discuss finite failure software reliability growth model using generalized inverse Weibull (GIW) distribution. The three parameter GIW distribution, which extends to several distributions and commonly used in lifetime literature, is more flexible than the inverse Weibull distribution.
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發(fā)表于 2025-3-22 10:20:53 | 只看該作者
Generalized Extended Inverse Weibull Software Reliability Growth Model,In this chapter, we discuss the generalized extended inverse Weibull (GEIW)?finite failure software reliability growth model which includes both increasing/decreasing nature of the hazard function.
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Software Reliability Growth Models978-981-16-0025-8Series ISSN 2363-6149 Series E-ISSN 2363-6157
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發(fā)表于 2025-3-23 08:20:18 | 只看該作者
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