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Titlebook: Silver Metallization; Stability and Reliab Daniel Adams,Terry L. Alford,James W. Mayer Book 2008 Springer-Verlag London 2008 Diffusion.PAS.

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發(fā)表于 2025-3-21 17:54:40 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Silver Metallization
副標(biāo)題Stability and Reliab
編輯Daniel Adams,Terry L. Alford,James W. Mayer
視頻videohttp://file.papertrans.cn/868/867373/867373.mp4
概述First book to discuss current knowledge of silver metallization and its potential as a favourable candidate for implementation as a future interconnect material for integrated circuit technology.Valua
叢書名稱Engineering Materials and Processes
圖書封面Titlebook: Silver Metallization; Stability and Reliab Daniel Adams,Terry L. Alford,James W. Mayer Book 2008 Springer-Verlag London 2008 Diffusion.PAS.
描述.Silver has the lowest resistivity of all metals, which makes it an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the thermal and electrical stability, as well as processing issues which, to date, have prevented the implementation of silver as an interconnect metal. Silver Metallization: Stability and Reliability is the first book to discuss current knowledge of silver metallization and its potential as a favorable candidate for implementation as a future interconnect material for integrated circuit technology...Silver Metallization: Stability and Reliability provides detailed information on a wide range of experimental, characterization and analysis techniques. It also presents the novel approaches used to overcome the thermal and electrical stability issues associated with silver metallization. Readers will learn about the: - preparation and characterization of elemental silver thin films and silver-metal alloys; - formation of diffusion barriers and adhesion promoters; - evaluation of the thermal stability of silver under different anneali
出版日期Book 2008
關(guān)鍵詞Diffusion; PAS; integrated circuit; metal; static-induction transistor; thin films
版次1
doihttps://doi.org/10.1007/978-1-84800-027-8
isbn_softcover978-1-84996-705-1
isbn_ebook978-1-84800-027-8Series ISSN 1619-0181 Series E-ISSN 2365-0761
issn_series 1619-0181
copyrightSpringer-Verlag London 2008
The information of publication is updating

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national comparisons of pupil performance: issues and policy’. It was arranged by two groups within the School of Education at the University, the newly formed Assessment and Evaluation Unit and the Centre for Studies in Science and Mathematics Education. Thejoint interest in international compariso
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national comparisons of pupil performance: issues and policy’. It was arranged by two groups within the School of Education at the University, the newly formed Assessment and Evaluation Unit and the Centre for Studies in Science and Mathematics Education. Thejoint interest in international compariso
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