| 書(shū)目名稱 | Scanning Electron Microscopy | | 副標(biāo)題 | Physics of Image For | | 編輯 | Ludwig Reimer | | 視頻video | http://file.papertrans.cn/862/861147/861147.mp4 | | 叢書(shū)名稱 | Springer Series in Optical Sciences | | 圖書(shū)封面 |  | | 描述 | The aim of this book is to outline the physics of image formation, electron- specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of Münster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron- specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec- tron beam can be blanked at high frequencies for time-resolving exper- iments and what problems have tobe taken into account when focusing. | | 出版日期 | Book 19851st edition | | 關(guān)鍵詞 | Rasterelektronen Mikroskopie; Scanning Tunneling Microscopy; ASTER; crystal; diffraction; electron; electr | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-662-13562-4 | | isbn_ebook | 978-3-662-13562-4Series ISSN 0342-4111 Series E-ISSN 1556-1534 | | issn_series | 0342-4111 | | copyright | Springer-Verlag Berlin Heidelberg 1985 |
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