Titlebook: Retailing; Peter Jones,Steve Baron Textbook 1991Latest edition Peter Jones and Steve Baron 1991

只看該作者 · 發(fā)表于 2025-3-21 16:48:03

書(shū)目名稱(chēng)Retailing影響因子(影響力)

書(shū)目名稱(chēng)Retailing影響因子(影響力)學(xué)科排名

書(shū)目名稱(chēng)Retailing網(wǎng)絡(luò)公開(kāi)度

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書(shū)目名稱(chēng)Retailing被引頻次

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書(shū)目名稱(chēng)Retailing年度引用

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書(shū)目名稱(chēng)Retailing讀者反饋

書(shū)目名稱(chēng)Retailing讀者反饋學(xué)科排名

只看該作者 · 發(fā)表于 2025-3-21 22:41:49

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

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只看該作者 · 發(fā)表于 2025-3-22 11:39:14

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

只看該作者 · 發(fā)表于 2025-3-22 13:53:30

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

只看該作者 · 發(fā)表于 2025-3-22 18:13:49

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

只看該作者 · 發(fā)表于 2025-3-22 22:06:45

只看該作者 · 發(fā)表于 2025-3-23 02:57:32

-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex

只看該作者 · 發(fā)表于 2025-3-23 05:41:55

Peter Jones,Steve Baron-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex

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