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Titlebook: Resistive Switching: Oxide Materials, Mechanisms, Devices and Operations; Jennifer Rupp,Daniele Ielmini,Ilia Valov Book 2022 Springer Natu

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樓主: bradycardia
11#
發(fā)表于 2025-3-23 11:17:21 | 只看該作者
Operating Mechanism and Resistive Switching Characteristics of Two- and Three-Terminal Atomic Switcmechanism is the growth and shrinkage of a metal filament formed between two electrodes, resulting in repeatable resistive switching between high-resistance and low-resistance states, which can be used for next-generation nonvolatile memories. This review focuses on the operating mechanism and resis
12#
發(fā)表于 2025-3-23 15:34:50 | 只看該作者
13#
發(fā)表于 2025-3-23 21:51:42 | 只看該作者
Volume Resistive Switching in Metallic Perovskite Oxides Driven by the Metal-Insulator Transition,onvolatile memory market. RRAM is based on the Resistive Switching (RS) effect, where a change in the resistance of the material can be reversibly induced upon the application of an electric field. In this sense, Strongly correlated complex oxides present unique intrinsic properties and extreme sens
14#
發(fā)表于 2025-3-24 00:51:54 | 只看該作者
Resistive States in Strontium Titanate Thin Films: Bias Effects and Mechanisms at High and Low Temp0?°C and 750?°C show a transition from predominant ionic to electronic conduction and lower conductivity of the thin films compared to the bulk of polycrystalline samples. Defect chemical changes at elevated temperature were investigated by applying a bias voltage. A model is described that successf
15#
發(fā)表于 2025-3-24 06:04:34 | 只看該作者
Single-Crystalline SrTiO3 as Memristive Model System: From Materials Science to Neurological and Ps understand the roles of oxygen vacancies and the Schottky barrier in the resistive switching. More importantly, SrTiO.-based memristive devices are used to emulate the neurological and psychological functions of the brain. The synaptic plasticity is achieved with Ni/Nb-SrTiO./Ti memristive devices,
16#
發(fā)表于 2025-3-24 10:26:18 | 只看該作者
17#
發(fā)表于 2025-3-24 10:40:45 | 只看該作者
18#
發(fā)表于 2025-3-24 14:50:36 | 只看該作者
19#
發(fā)表于 2025-3-24 21:57:27 | 只看該作者
Nanoscale Characterization of Resistive Switching Using Advanced Conductive Atomic Force Microscopyctric to observe the shape of the filament in three dimensions. The genuine combination of electrical and mechanical stresses via CAFM tip can lead to additional setups, such as pressure-modulated conductance microscopy. In the future, new experiments and CAFM-related techniques may be designed to deepen into the knowledge of resistive switching.
20#
發(fā)表于 2025-3-25 01:04:15 | 只看該作者
Reset Switching Statistics of TaOx-Based Memristor,ctive filament (CF) in three different memristor materials (TaO., HfO., and NiO). The high-performance materials tend to exhibit a higher Weibull slope and there are no variation and extra heat generated in the CF before the reset event.
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