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Titlebook: Resilient Computer System Design; Victor Castano,Igor Schagaev Book 2015Latest edition Springer International Publishing Switzerland 2015

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樓主: 選民
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發(fā)表于 2025-3-23 10:48:38 | 只看該作者
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發(fā)表于 2025-3-23 17:31:24 | 只看該作者
Impact of Radiation on Electronics,herefore, prior to the design of a resilient architecture, several factors shall be considered in the earliest phases of the system design. The physics of radiation-induced faults, the study of the error process and the sources of error are discussed..The phenomenon that causes faults at the physica
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發(fā)表于 2025-3-23 21:53:59 | 只看該作者
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發(fā)表于 2025-3-23 22:56:15 | 只看該作者
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發(fā)表于 2025-3-24 05:31:07 | 只看該作者
System Software Support,rily complete three tasks: detection, determination and recovery..Due to the fact that these tasks can be easily decoupled, we treat them independently. The occurrence of a fault is, in general, a rare event, and therefore, the error detection, determination and recovery mechanisms are executed with
16#
發(fā)表于 2025-3-24 06:55:20 | 只看該作者
Implementation: Hardware Prototype, Comparisons, Simulation and Testing,w theory of resilient systems are organised in the previous six chapters, as a next step, there is a need to demonstrate “proof of the concept” and do-ability of the proposed ideas on the existing hardware prototype. Thus, implementation efforts can be summarised as twofold:.The hardware prototype m
17#
發(fā)表于 2025-3-24 10:45:16 | 只看該作者
Vision on Evolving System Future,xisting systems, explaining limitations of hardware and software coexistence..New design principles, models of representation for algorithms and architecture are introduced and described with an explanation regarding how to achieve better parallelism and reduce concurrency. Structure of required sys
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發(fā)表于 2025-3-24 16:38:29 | 只看該作者
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發(fā)表于 2025-3-24 19:37:21 | 只看該作者
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發(fā)表于 2025-3-24 23:39:07 | 只看該作者
Impact of Radiation on Electronics,l level is reviewed. This chapter presents a review of unwanted effects in semiconductor devices caused by high-energy particles focusing on standard electronic materials: silicon and its oxide. We learn that the number of faults and in particular the ones due to radiation are expected to increase significantly.
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