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Titlebook: Reliability of Organic Compounds in Microelectronics and Optoelectronics; From Physics-of-Fail Willem Dirk van Driel,Maryam Yazdan Mehr Boo

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樓主: solidity
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發(fā)表于 2025-3-28 15:32:23 | 只看該作者
42#
發(fā)表于 2025-3-28 20:04:40 | 只看該作者
Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis,igher reliability, longer lifetime, and higher efficiency compared with other light sources. The demand for increased lifetime and higher reliability has attracted a significant number of research studies on the prognostics and lifetime estimation of LEDs, ranging from the traditional failure data a
43#
發(fā)表于 2025-3-29 02:09:07 | 只看該作者
Reliability and Failures in Solid State Lighting Systems,onfronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness, and reliability requirements. The scientif
44#
發(fā)表于 2025-3-29 03:09:58 | 只看該作者
45#
發(fā)表于 2025-3-29 08:27:57 | 只看該作者
46#
發(fā)表于 2025-3-29 12:03:52 | 只看該作者
Artificial Intelligence and LED Degradation, the improvements in computational power from the hardware. Meanwhile, there is easy access and availability of data from various platforms. AI technologies with data science can help solve many industrial problems like tracking Solid-state Lighting (SSL) system degradation, classifying LED failures
47#
發(fā)表于 2025-3-29 16:01:20 | 只看該作者
Degradation Analysis for Reliability of Optoelectronics,exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-b
48#
發(fā)表于 2025-3-29 22:15:28 | 只看該作者
Reliability and Failure of Microelectronic Materials,duct lifetime is highly desirable so that extended use is feasible. Inaddition to this, the reliability requirements for such components are also becoming more stringent, in steadily more extreme applications. For that purpose, we need to understand the degradation mechanisms in microelectronic devi
49#
發(fā)表于 2025-3-30 03:19:19 | 只看該作者
Degradation and Remaining Useful Life Prediction of Automotive Electronics, operation such as smart home application that can control temperature in our homes to highly sophisticated transportation systems that we have already on airports. Soon we will see them on our streets. Availability of these highly automated and autonomous solutions depends on electronic components
50#
發(fā)表于 2025-3-30 08:02:46 | 只看該作者
Reliability and Degradation of Power Electronic Materials,r electronics (PE) can be due to a manifold of mechanisms. Even in a single PE device multiple failure processes may compete. For instance, modules may contain various components that fail according to different processes. When testing a batch of devices with competing processes, the resulting failu
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