Titlebook: Reliability of Nanoscale Circuits and Systems; Methodologies and Ci Milo? Stanisavljevi?,Alexandre Schmid,Yusuf Lebleb Book 2011 Springer S

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https://doi.org/10.1007/978-1-4419-6217-1Averaging Design Implementations; Fault Models; Fault-Tolerant Approaches; Fault-Tolerant Architectures

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Reliability, Faults, and Fault Tolerance,h are applied to guarantee optimal operability of VLSI systems, fault?tolerance, and circuit architectures implementing them. Basic terms such as reliability, fault?tolerance, faults, and fault modeling are introduced and explained in detail.

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Statistical Evaluation of Fault Tolerance Using Probability Density Functions,rifying the theoretical results on the one side and also enables design improvement with respect to their reliability figure by selecting the most suitable (nano)architecture that satisfies all delay, power, area, and reliability requirements on the other.

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Book 2011eliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

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Nanotechnology and Nanodevices,The end of the ITRS roadmap for classical CMOS devices and circuits envisions the emergence of future nanotechnologies and nanodevices and also evidences many new related challenges. This chapter covers some of these issues using a tutorial presentation style.

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Hiroaki Tanaka,Shinsuke Kobayashi,Yoshinori Takeuchi,Keishi Sakanushi,Masaharu Imai dann der Lagrangeformalismus und seine wichtigsten Anwendungen.Danach wird der Hamiltonformalismus eingeführt, und die Kontinuumsmechanik wird anhand ausgew?hlter Anwendungsbeispiele vorgestellt. Der letzte Teil behandelt ausführlich die Spezielle Relativit?tstheorie.978-3-8274-2188-3