找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: Reduced Thermal Processing for ULSI; Roland A. Levy Book 1989 Plenum Press, New York 1989 Doping.defects.dielectrics.electronics.epitaxy

[復(fù)制鏈接]
樓主: EVOKE
11#
發(fā)表于 2025-3-23 11:50:19 | 只看該作者
12#
發(fā)表于 2025-3-23 14:14:47 | 只看該作者
13#
發(fā)表于 2025-3-23 20:50:42 | 只看該作者
Low Temperature Silicon Epitaxy for Novel Device Structures,lar and CMOS device performance. Therefore, this paper will present some very attractive new advanced device structures that are possible through the use of low temperature/low pressure (LT/LP) production worthy epitaxial growth techniques that address these ULSI submicron device processing issues.
14#
發(fā)表于 2025-3-24 01:06:56 | 只看該作者
15#
發(fā)表于 2025-3-24 04:43:56 | 只看該作者
Micrometallization Technologies,ontact resistance, fine-line patternability, resistance to electromigration, strong adherence and good step coverage and conformality. Sometimes all of these requirements cannot be optimized simultaneously and one is forced to adopt a compromise.
16#
發(fā)表于 2025-3-24 09:12:27 | 只看該作者
17#
發(fā)表于 2025-3-24 14:06:40 | 只看該作者
Silicidation by Rapid Thermal Processing,ty and enhanced circuit performance. This was made possible by the use of larger chip areas, but also by a continuous drive towards miniaturization, based upon the classical laws of scaling as introduced by Dennard et al. [1]. In these laws, all device dimensions are reduced by a factor λ, and other
18#
發(fā)表于 2025-3-24 16:26:48 | 只看該作者
Microstructural Defects in Rapid Thermally Processed IC Materials,c requirements. The first of these requirements is that the “active” insulators in MOS devices must be ultra thin, typically below 10 nm thick. Using conventional furnace oxidation it is difficult to produce such thin oxides because the oxidation times are too short to be reproducibly controlled. As
19#
發(fā)表于 2025-3-24 21:17:34 | 只看該作者
Rapid Thermal Annealing - Theory and Practice,ing technology for annealing, oxidation, interfacial reaction, solid state diffusion and many other physical changes in the silicon and its overlayers. Despite this central role, heat-treatment has for much of this time been carried out in basically the same way, in contrast to the radical changes t
20#
發(fā)表于 2025-3-25 00:57:58 | 只看該作者
Rapid Thermal Process Integration,ted and demonstrated thoroughly over the past few years and many excellent reviews of these techniques are now available.. Hundreds of papers have been published dealing with isolated RTP process techniques such as oxidation/nitridation., junction annealing., thermal silicidation., densification and
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經(jīng)驗總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-6 12:47
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
普宁市| 灵宝市| 招远市| 通渭县| 海晏县| 南昌市| 建湖县| 托里县| 增城市| 台北县| 遂平县| 马龙县| 吉安县| 洛隆县| 南汇区| 当阳市| 荥经县| 黄大仙区| 铜山县| 铜鼓县| 吉安县| 芜湖县| 定日县| 绥江县| 曲麻莱县| 兴和县| 龙南县| 建宁县| 鹤岗市| 伊春市| 法库县| 都兰县| 内丘县| 怀来县| 保亭| 姚安县| 招远市| 图木舒克市| 泰宁县| 格尔木市| 井冈山市|