Titlebook: Recent Advances in Metrology; Select Proceedings o Sanjay Yadav,K.P. Chaudhary,Naveen Garg Conference proceedings 2023 The Editor(s) (if ap

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Error Analysis in Measurement of Electrical Conductivity,on the performance of material which is gauged by figure of merit (ZT). The ZT comprises three interrelating parameters, namely Seebeck coefficient (.), electrical conductivity (.) and thermal conductivity (.). Out of these three parameters, this review article focuses on only electrical conductivit

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Establishment of Metrological Traceability of AC Resistance Using Electrical Equivalent Circuit at d range of the resistance standard. The procedure for the establishment of metrological traceability involves the measurement of reference resistance at DC and parasitic components at AC frequencies. The uncertainty in measurement of AC resistance is also computed as per the GUM document.

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Calibration of Pentaprism and Its Uncertainty Evaluation at NPL, India,ical model. The calibration of pentaprism is set up at NPL, length and dimension and nanometrology division of NPL, India. Authors attempted to device a new analytical method contrary to the conventional method. The necessary experiments are performed to validate the results.

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A Review on Sources of Uncertainty in Thermal Conductivity Measurement for Thermal Transport Metrolre the thermoelectric performance of materials. In this article, we have highlighted the sources of uncertainty occurring in the measurement of thermal conductivity that includes the combined errors in measurement of density, thermal diffusivity and heat capacity.

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Conference proceedings 2023te of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial applicati

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Conference proceedings 2023and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.?.