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Titlebook: Recent Advances in Intrusion Detection; 5th International Sy Andreas Wespi,Giovanni Vigna,Luca Deri Conference proceedings 2002 Springer-Ve

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發(fā)表于 2025-3-21 17:03:33 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Recent Advances in Intrusion Detection
副標(biāo)題5th International Sy
編輯Andreas Wespi,Giovanni Vigna,Luca Deri
視頻videohttp://file.papertrans.cn/823/822811/822811.mp4
概述Includes supplementary material:
叢書名稱Lecture Notes in Computer Science
圖書封面Titlebook: Recent Advances in Intrusion Detection; 5th International Sy Andreas Wespi,Giovanni Vigna,Luca Deri Conference proceedings 2002 Springer-Ve
描述On behalf of the program committee, it is our pleasure to present to you the proceedings of the Fifth Symposium on Recent Advances in Intrusion Detection (RAID). Since its ?rst edition in 1998, RAID has established itself as the main annual intrusion detection event, attracting researchers, practitioners, and v- dors from all over the world. The RAID 2002 program committee received 81 submissions (64 full papers and 17 extended abstracts) from 20 countries. This is about 50% more than last year. All submissions were carefully reviewed by at least three program comm- tee members or additional intrusion-detection experts according to the criteria ofscienti?cnovelty,importancetothe?eld,andtechnicalquality.Finalselection took place at a meeting held on May 15–16, 2002, in Oakland, USA. Sixteen full papers were selected for presentation and publication in the conference proc- dings. In addition, three extended abstracts of work in progress were selected for presentation. The program included both fundamental research and practical issues. The seven sessions were devoted to the following topics: anomaly detection, steppi- stonedetection,correlationofintrusion-detectionalarms,assessmentof
出版日期Conference proceedings 2002
關(guān)鍵詞Anomaly Detection; Audit Control; Authentication; Cryptanalysis; Distributed Intrusion; Intrusion Detecti
版次1
doihttps://doi.org/10.1007/3-540-36084-0
isbn_softcover978-3-540-00020-4
isbn_ebook978-3-540-36084-1Series ISSN 0302-9743 Series E-ISSN 1611-3349
issn_series 0302-9743
copyrightSpringer-Verlag Berlin Heidelberg 2002
The information of publication is updating

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Kymie M. C. Tan,Kevin S. Killourhy,Roy A. Maxion, and low and high current specifications. Functional tests determine whether the internal digital logic and analog sub-systems in the chip behave as intended. The major cost in testing is digital and analog functional tests.Parametric test is a tiny part of the cost,because it is very short,and tes
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Benjamin Morin,Ludovic Mé,Hervé Debar,Mireille Ducasséand there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than
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