Titlebook: Rapid Reliability Assessment of VLSICs; A. P. Dorey,B. K. Jones,Y. Z. Xu Book 1990 Plenum Press, New York 1990 CMOS.Modulation.VLSI.analog

Radiation

noxious

Tortuous

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萬花筒

Introduction to VLSI Testing,ich the circuit is used. However, in some applications where the replacement cost is high or the consequences of failure are serious, highly reliable devices of high quality are needed. Examples of such uses are in satellites, undersea cable, remote stations, manned space vehicles and for military systems.

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Mundane

Assessment of the Tests as Predictors of Failure,In this section we will illustrate the usefulness of the devised tests by referring to the behavior of the devices subject to thermal and electrical stress. Before we discuss this in detail in the next few subsections we first of all introduce the experimental details for reference.

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craven

The Devices Studied and their Simulation,cuit simulation package, PSPICE (Microsim Corporation), which i3 a version written for use on the IBM personal computer. The simulations gave the size and shape of the waveforms occuring in the circuits being studied and the effect of different conditions within the circuit on these waveforms.