書目名稱 | Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing |
編輯 | Jeffrey Prinzie,Michiel Steyaert,Paul Leroux |
視頻video | http://file.papertrans.cn/821/820441/820441.mp4 |
概述 | Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research.Describes in detail advanced techniques to harden circuits against ioniz |
叢書名稱 | Analog Circuits and Signal Processing |
圖書封面 |  |
描述 | .This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs..Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research.Describes in detail advanced techniques to harden circuits against ionizing radiation.Provides a practical way to learn and understand radiation effects in time-based circuits.Includes an introduction to the underlying physics, circuitdesign, and advanced techniques accompanied with experimental data. |
出版日期 | Book 2018 |
關鍵詞 | Radiation-Tolerant Circuits; Radiation-hardened circuits; Soft errors; Fault-tolerant design; Radiation |
版次 | 1 |
doi | https://doi.org/10.1007/978-3-319-78616-2 |
isbn_softcover | 978-3-030-08745-6 |
isbn_ebook | 978-3-319-78616-2Series ISSN 1872-082X Series E-ISSN 2197-1854 |
issn_series | 1872-082X |
copyright | Springer International Publishing AG, part of Springer Nature 2018 |