Titlebook: Radiation Effects on Integrated Circuits and Systems for Space Applications; Raoul Velazco,Dale McMorrow,Jaime Estela Book 2019 Springer N

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Single-Event Effects Test Methods,dations for choosing test patterns during testing; advantages and disadvantages of static and dynamic testing; impact of total ionizing dose effects on test results; specifics of testing for destructive types of SEEs and others. Recommendations for choosing the SEE test algorithms are summarized.

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System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUsodel of the processor is formalized as a Continuous-Time Markov Chain (CTMC). Probabilistic model checking (PMC) is utilized to exhaustively estimate the impact of SEUs on the behavior of the processor. The proposed CTMC model is analyzed for different SEU injection scenarios and different bit-flip

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Single-Event Effects Test Methods, to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including requirements for the energy of ions, their linear energy transfer (LET) and the range in semico

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