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Titlebook: RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors; Keith A. Jenkins Book 2022 Springer Nature Switzerland AG 20

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發(fā)表于 2025-3-21 18:55:39 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
編輯Keith A. Jenkins
視頻videohttp://file.papertrans.cn/821/820109/820109.mp4
概述Describes an arsenal of dynamic, RF and time-domain techniques to understand and characterize the behavior of novel transistors made of graphene, carbon nanotubes and silicon-on-insulator, and using n
圖書(shū)封面Titlebook: RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors;  Keith A. Jenkins Book 2022 Springer Nature Switzerland AG 20
描述.This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures.? The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel ?transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs.? Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understandthe relationship between these measurements and traditional, conventional DC characteristics.?.
出版日期Book 2022
關(guān)鍵詞Characterization of novel transistors; electrical performance of novel devices; Frequency characteriza
版次1
doihttps://doi.org/10.1007/978-3-030-77775-3
isbn_softcover978-3-030-77777-7
isbn_ebook978-3-030-77775-3
copyrightSpringer Nature Switzerland AG 2022
The information of publication is updating

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發(fā)表于 2025-3-21 22:13:47 | 只看該作者
https://doi.org/10.1007/978-3-030-77775-3Characterization of novel transistors; electrical performance of novel devices; Frequency characteriza
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發(fā)表于 2025-3-22 01:56:54 | 只看該作者
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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發(fā)表于 2025-3-22 15:38:26 | 只看該作者
RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors978-3-030-77775-3
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發(fā)表于 2025-3-22 22:03:02 | 只看該作者
Measurement of the Frequency Response of Transistors,apacitance which is small compared to the parasitic probe input capacitance, which occurs for back-gated transistors. The frequency response of very low current transistors can be evaluated with direct measurements of power gain as a function of frequency, but input-to-output crosstalk limits the fr
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發(fā)表于 2025-3-23 02:22:52 | 只看該作者
Measurement of the Large-Signal Propagation Delay of Single Transistors, to evaluate conventional microelectronics, modification of the structures and measurement techniques can also be used to go beyond performance measurement to assess aging, drift, and time-dependence, which might occur in novel transistors.
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發(fā)表于 2025-3-23 07:07:41 | 只看該作者
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