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Titlebook: Quantum Communication, Computing, and Measurement; O. Hirota,A. S. Holevo,C. M. Caves Book 1997 Plenum Press, New York 1997 coherence.deco

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41#
發(fā)表于 2025-3-28 15:39:12 | 只看該作者
Charles H. Bennett,Christopher A. Fuchs,John A. Smolintive. On the other hand, we know experimentally and theoretically that the adsorption bond of molecules on metals takes perturbation of additives. Based on them, the role of promoting materials is so often explained by the term “synergetic effect” or “activation of metals,” but this is awkward expla
42#
發(fā)表于 2025-3-28 22:14:05 | 只看該作者
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發(fā)表于 2025-3-28 22:55:52 | 只看該作者
44#
發(fā)表于 2025-3-29 03:08:47 | 只看該作者
J. I. Cirac,T. Pellizzari,J. F. Poyatos,P. Zollerroviders to revel?on an?increased scale and reach more?than that?is achievable individually. Current research efforts in this context mainly focus on building supply chain collaboration (SCC) models, in which CPs leverage cloud services from other CPs for seamless provisioning. Nevertheless, in the
45#
發(fā)表于 2025-3-29 08:55:01 | 只看該作者
46#
發(fā)表于 2025-3-29 12:12:26 | 只看該作者
heir limitations...This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the mo978-1-4419-3849-7978-0-387-25903-1Series ISSN 0893-3405
47#
發(fā)表于 2025-3-29 19:34:38 | 只看該作者
48#
發(fā)表于 2025-3-29 21:05:01 | 只看該作者
49#
發(fā)表于 2025-3-30 00:04:54 | 只看該作者
Masashi Ban,Masao Osaki,Osamu Hirotaheir limitations...This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the mo978-1-4419-3849-7978-0-387-25903-1Series ISSN 0893-3405
50#
發(fā)表于 2025-3-30 04:56:26 | 只看該作者
Kentaro Kato,Masao Osaki,Tomohiro Suzuki,Masashi Ban,Osamu Hirotaheir limitations...This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the mo978-1-4419-3849-7978-0-387-25903-1Series ISSN 0893-3405
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