| 書目名稱 | Principles of Analytical Electron Microscopy | | 編輯 | David C. Joy,Alton D. Romig,Joseph I. Goldstein | | 視頻video | http://file.papertrans.cn/756/755454/755454.mp4 | | 圖書封面 |  | | 描述 | Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today‘s state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility o | | 出版日期 | Book 1986 | | 關(guān)鍵詞 | X-Ray; biology; diffraction; electron diffraction; electron microscopy; electron optics; materials charact | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4899-2037-9 | | isbn_softcover | 978-1-4899-2039-3 | | isbn_ebook | 978-1-4899-2037-9 | | copyright | Springer Science+Business Media New York 1986 |
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