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Titlebook: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O; Kipp van Schooten Book 2013 Springer

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發(fā)表于 2025-3-21 19:56:22 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O
編輯Kipp van Schooten
視頻videohttp://file.papertrans.cn/703/702735/702735.mp4
概述Nominated by the University of Utah, USA, as an outstanding Ph.D. thesis.Lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precis
叢書名稱Springer Theses
圖書封面Titlebook: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O;  Kipp van Schooten Book 2013 Springer
描述.Colloidal nanocrystals show much promise as an optoelectronics architecture due to facile control over electronic properties afforded by chemical control of size, shape, and heterostructure. Unfortunately, realizing practical devices has been forestalled by the ubiquitous presence of charge "trap" states which compete with band-edge excitons and result in limited device efficiencies. Little is known about the defining characteristics of these traps, making engineered strategies for their removal difficult..This thesis outlines pulsed optically detected magnetic resonance as a powerful spectroscopy of the chemical and electronic nature of these deleterious states. Counterintuitive for such heavy atom materials, some trap species possess very long spin coherence lifetimes (up to 1.6 μs). This quality allows use of the trapped charge‘s magnetic moment as a local probe of the trap state itself and its local environment. Beyond state characterization, this spectroscopy can demonstrate novel effects in heterostructured nanocrystals, such as spatially-remote readout of spin information and the coherent control of light harvesting yield. .
出版日期Book 2013
關(guān)鍵詞CdSe/CdS Nanocrystals; Colloidal Nanocrystals; Electron Spin Resonance; Light Harvesting; Optically Acti
版次1
doihttps://doi.org/10.1007/978-3-319-00590-4
isbn_softcover978-3-319-03328-0
isbn_ebook978-3-319-00590-4Series ISSN 2190-5053 Series E-ISSN 2190-5061
issn_series 2190-5053
copyrightSpringer International Publishing Switzerland 2013
The information of publication is updating

書目名稱Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O影響因子(影響力)




書目名稱Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O影響因子(影響力)學(xué)科排名




書目名稱Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O網(wǎng)絡(luò)公開度




書目名稱Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed O網(wǎng)絡(luò)公開度學(xué)科排名




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Summary of Work,e in boundary conditions on their electronic states is quite large given the wide variety of semiconductor materials, heterostructure configurations, and geometric dimensions available. Thus, these nanocrystals serve as a rich playground for observing single, paired, and multicharge dynamics under a
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