Titlebook: Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources; Federico Canova,Luca Poletto Book 2015 Springer-Verlag Berli

Ondines-curse

Willem Boutu,Mathieu Ducousso,Jean-Fran?ois Hergott,Hamed Merdjirs. Hohe Fahrzeug- cherheit und Qualit?tsansprüche, geringst m?gliche Abgaswerte, niedriges Au?en- r?usch, geringer Verbrauch und damit verbunden geringe CO -Emissionen, akzeptable 2 Fahrleistungen, erweiterte Variantenzahl pro Hersteller, Integration in Verkehrssysteme und internationaler Wettbewer

傳染

Affection

Taro Sekikawar. Die Vektoranalysis ist ein klassisches Teilgebiet der Mathematik mit vielf?ltigen Anwendungen, zum Beispiel in der Physik. Das Buch führt die Studierenden in die Welt der Differentialformen undAnalysis auf Untermannigfaltigkeiten des Rn ein. Teile des Buches k?nnen auch sehr gut für Vorlesungen i

注視

978-3-662-51686-7Springer-Verlag Berlin Heidelberg 2015

nocturnal

jettison

The Soft X-ray Free-Electron Laser FLASH at DESY,olet and soft X-ray range. Efficient photon beam transport and diagnostics play an essential role in exploiting the features of this new generation of light sources in a large variety of user experiments. A detailed overview of the FLASH user facility is presented.

Modicum

Priapism

Temporal Characterization of Ultrashort Extreme-Ultraviolet and Soft X-ray Pulses,ble to characterize these pulses in the temporal domain. In this chapter we will present and discuss the most important methods for temporal pulse characterization, with particular emphasis on attosecond pulses generated by high-order harmonics and on femtosecond soft X-ray pulses emitted by free electron lasers.

avenge

Multilayer Mirrors for Coherent Extreme-Ultraviolet and Soft X-ray Sources, XUV range. We then focus on the specificities of multilayer mirrors for pico- and femtosecond sources, in terms of reflectivity, selectivity and stability. Finally, we report the recent advances in the development of multilayer mirrors for attosecond sources, from the design of the mirror to the characterization of such a component.

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