| 書目名稱 | On-Line Testing for VLSI | | 編輯 | Michael Nicolaidis,Yervan Zorian,Dhiraj K. Pradan | | 視頻video | http://file.papertrans.cn/702/701323/701323.mp4 | | 叢書名稱 | Frontiers in Electronic Testing | | 圖書封面 |  | | 描述 | Test functions (fault detection, diagnosis, error correction,repair, etc.) that are applied concurrently while the system continuesits intended function are defined as .on-line testing.. In itsexpanded scope, on-line testing includes the design of concurrenterror checking subsystems that can be themselves self-checking,fail-safe systems that continue to function correctly even after anerror occurs, reliability monitoring, and self-test and fault-tolerantdesigns. ..On-Line Testing for VLSI. contains a selected set of articlesthat discuss many of the modern aspects of on-line testing as facedtoday. The contributions are largely derived from recent .IEEEInternational. .On-Line Testing Workshops.. Guest editorsMichael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized thearticles into six chapters. In the first chapter the editors introducea large number of approaches with an expanded bibliography in whichsome references date back to the sixties. ..On-Line Testing for VLSI. is an edited volume of originalresearch comprising invited contributions by leading researchers. | | 出版日期 | Book 1998 | | 關(guān)鍵詞 | ASIC; CMOS; Hardware; Sensor; VLSI; communication; integrated circuit; single-electron transistor | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4757-6069-9 | | isbn_softcover | 978-1-4419-5033-8 | | isbn_ebook | 978-1-4757-6069-9Series ISSN 0929-1296 | | issn_series | 0929-1296 | | copyright | Springer Science+Business Media New York 1998 |
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