找回密碼
 To register

QQ登錄

只需一步,快速開(kāi)始

掃一掃,訪問(wèn)微社區(qū)

打印 上一主題 下一主題

Titlebook: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits; Qiang Cui,Juin J. Liou,Parthasarathy Srivatsan

[復(fù)制鏈接]
查看: 26349|回復(fù): 37
樓主
發(fā)表于 2025-3-21 19:52:35 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
編輯Qiang Cui,Juin J. Liou,Parthasarathy Srivatsan
視頻videohttp://file.papertrans.cn/702/701314/701314.mp4
概述Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies.Enables readers to design effective ESD protection solutions for
圖書(shū)封面Titlebook: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits;  Qiang Cui,Juin J. Liou,Parthasarathy Srivatsan
描述This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices.?The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies.?Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
出版日期Book 2015
關(guān)鍵詞ESD Protection for BiCMOS RFICs; ESD Protection for GaAs RFICs; ESD Protection for RFICs; ESD Protectio
版次1
doihttps://doi.org/10.1007/978-3-319-10819-3
isbn_softcover978-3-319-35824-6
isbn_ebook978-3-319-10819-3
copyrightSpringer International Publishing Switzerland 2015
The information of publication is updating

書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits影響因子(影響力)




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits影響因子(影響力)學(xué)科排名




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits被引頻次




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits被引頻次學(xué)科排名




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits年度引用




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits年度引用學(xué)科排名




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits讀者反饋




書(shū)目名稱On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits讀者反饋學(xué)科排名




單選投票, 共有 1 人參與投票
 

1票 100.00%

Perfect with Aesthetics

 

0票 0.00%

Better Implies Difficulty

 

0票 0.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用戶組沒(méi)有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-21 21:09:48 | 只看該作者
ts. Durch das Aufspüren eines vasoaktiven Materials in der Niere, das Renin-Angiotensin, wurde klar, da? es sich bei der Niere nicht nur um ein nützliches Ausscheidungsorgan für über-flüssige oder st?rende Chemikalien im K?rper handelt, sondern um ein Organ, das auch vorrangig auf die Hom?ostase des
板凳
發(fā)表于 2025-3-22 02:11:47 | 只看該作者
Basics in ESD Protection of Radio Frequency Integrated Circuits,y threat as it is present in all IC manufacturing processes from mainstream silicon-based complementary metal–oxide–semiconductor (CMOS) to the more exotic compound semiconductor processes such as gallium arsenide (GaAs) or gallium nitride (GaN).
地板
發(fā)表于 2025-3-22 04:37:33 | 只看該作者
On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process,ing sufficient ESD protection for RF and high-speed mixed signal ICs using mainstream CMOS processes imposes a major design and reliability challenge. Ideally ESD protection must be transparent to the protected core circuitry under normal operation conditions. In reality, interaction always exists b
5#
發(fā)表于 2025-3-22 11:26:44 | 只看該作者
6#
發(fā)表于 2025-3-22 13:34:53 | 只看該作者
7#
發(fā)表于 2025-3-22 20:32:20 | 只看該作者
Conclusion, and other high-speed applications. The reliable daily usage of these RF electronics cannot be assured, however, unless the issue of electrostatic discharge (ESD) protection is properly addressed and implemented. As the semiconductor technology continues to scale down, ESD reliability concern is bec
8#
發(fā)表于 2025-3-23 00:36:40 | 只看該作者
On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process,ges in RF ESD design, as a low capacitance typically means a small device area and consequently a poor robustness of the ESD protection device. Other concerns in ESD design for RF ICs include the signal distortion due to the nonlinearity of the parasitic capacitance, the noise coupling as well as no
9#
發(fā)表于 2025-3-23 03:11:53 | 只看該作者
10#
發(fā)表于 2025-3-23 08:55:59 | 只看該作者
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛(ài)論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評(píng) 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國(guó)際 ( 京公網(wǎng)安備110108008328) GMT+8, 2026-1-18 21:05
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
乌拉特中旗| 台中市| 阿城市| 当阳市| 兴隆县| 霍邱县| 盘山县| 永平县| 大同县| 南川市| 高邮市| 眉山市| 云和县| 探索| 淮滨县| 台前县| 邢台市| 上思县| 乌拉特中旗| 盈江县| 赣榆县| 柯坪县| 永修县| 佛山市| 东丽区| 大丰市| 黑山县| 都昌县| 凤山县| 奇台县| 磐石市| 土默特右旗| 黄冈市| 砚山县| 毕节市| 娄烦县| 阿克陶县| 肥东县| 金坛市| 江都市| 巴林右旗|