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Titlebook: Observational Evidence for Black Holes in the Universe; Proceedings of a Con Sandip K. Chakrabarti Conference proceedings 1999 Springer Sci

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樓主: 可擴(kuò)大
51#
發(fā)表于 2025-3-30 11:27:16 | 只看該作者
this concept usually refers to a sequence of operations carried out in a single work chamber, or a series of such work chambers [1]. Figure 1 conceptually illustrates such a system which in this case is designed for Ultra High Vacuum (UHV) processing. The transfer from chamber to chamber is highly
52#
發(fā)表于 2025-3-30 15:37:26 | 只看該作者
53#
發(fā)表于 2025-3-30 18:22:13 | 只看該作者
54#
發(fā)表于 2025-3-30 21:42:57 | 只看該作者
55#
發(fā)表于 2025-3-31 03:00:23 | 只看該作者
Ju-Fu Lu (i.e. resist-level patterns) are common to virtually all fabrication processes. Wafer defects are considered in Section 3.1 while lithography defects are discussed in Section 3.2. There are also major defect mechanisms arising during deposition and etching of the thin film dielectric and metalizati
56#
發(fā)表于 2025-3-31 08:54:43 | 只看該作者
Dongsu Ryueffects. Defects during patterning or film depositions can lead to shorts, open lines or defective transistors, as discussed in the previous chapter. Such defect-based faults are considered in this chapter. However, faults also arise through degradation in features, such as electromigration failure
57#
發(fā)表于 2025-3-31 11:07:01 | 只看該作者
D. Molteni,G. Gerardi,M. A. Valenza,G. Lanzafameeffects. Defects during patterning or film depositions can lead to shorts, open lines or defective transistors, as discussed in the previous chapter. Such defect-based faults are considered in this chapter. However, faults also arise through degradation in features, such as electromigration failure
58#
發(fā)表于 2025-3-31 16:15:05 | 只看該作者
B. Mukhopadhyayl-purpose testing schemes. Three distinct circuit functions (memory arrays, regular logic arrays and programmable logic arrays) are used as examples of the various techniques which can be used. A major issue for special purpose testing is reduction of the size of the set of test vectors, drawing on
59#
發(fā)表于 2025-3-31 19:10:48 | 只看該作者
Tapas K. Dasditions of office work and the relations between clerical workers and management. A growing disjunction between office clerical workers and management in the insurance industry has accompanied office automation during the post-World War II era. As management automates the office to raise worker prod
60#
發(fā)表于 2025-3-31 23:58:53 | 只看該作者
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