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Titlebook: Normal and Abnormal Fetal Face Atlas; Ultrasonographic Fea Jean-Marc Levaillant,Jean-Philippe Bault,Gérard Co Book 2017 Springer Internatio

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書目名稱Normal and Abnormal Fetal Face Atlas
副標(biāo)題Ultrasonographic Fea
編輯Jean-Marc Levaillant,Jean-Philippe Bault,Gérard Co
視頻videohttp://file.papertrans.cn/669/668039/668039.mp4
概述Highlights innovative embryology, adapted to the needs of sonographers.Covers 2D and 3D dimensional images.Includes detailed examinations of the normal and abnormal fetal face.Features diagnostic deci
圖書封面Titlebook: Normal and Abnormal Fetal Face Atlas; Ultrasonographic Fea Jean-Marc Levaillant,Jean-Philippe Bault,Gérard Co Book 2017 Springer Internatio
描述This atlas offers a guide to studying the fetal face by means of ultrasound analysis. It describes key phases in cranial-facial development, allowing the reader to learn the related semiology from its most simple iteration to the most complex one.?.The overall examination of a newborn’s face offers a rich source of information and can guide the general examination. The same applies in the context of fetal ultrasound examination. The analytical study of the fetal face not only makes it possible to screen for anomalies related to the face itself, but also yields valuable insights into the brain, the limbs, and the heart. In addition, it allows ultra-sonographers to unravel the puzzle of fetal dimorphism..Written in a pedagogical style, the book guides walks the reader through the diagnostic reasoning process step by step.?.The authors are pioneers in this field and teach in various university and master’s degree ultrasound programs. Their aim is to share with readers their diagnostic approaches and their knowledge and passion for 2D and 3D ultrasound techniques. Each chapter includes algorithms, biometry curves, and simple guidelines that allow users to go “from sign to syndrome”. Th
出版日期Book 2017
關(guān)鍵詞Fetal medicine; Facial dysmorphism; Facial clefts; Facial embryology; 2D and 3D ultrasound; Diagnostic Ra
版次1
doihttps://doi.org/10.1007/978-3-319-43769-9
isbn_softcover978-3-319-82906-7
isbn_ebook978-3-319-43769-9
copyrightSpringer International Publishing Switzerland 2017
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Jean-Marc Levaillant,Jean-Philippe Bault,Bernard Benoit,Gérard Couly used. For those domains of product design that are highly dependent on transistor-level circuit design and optimization, such as high-speed logic and memory, mixed-signal analog-digital int- faces, RF functions, power integrated circuits, and so forth, circuit simulation is perhaps the single most
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Jean-Marc Levaillant,Jean-Philippe Bault,Bernard Benoit,Gérard Couly used. For those domains of product design that are highly dependent on transistor-level circuit design and optimization, such as high-speed logic and memory, mixed-signal analog-digital int- faces, RF functions, power integrated circuits, and so forth, circuit simulation is perhaps the single most
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978-3-319-82906-7Springer International Publishing Switzerland 2017
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