Titlebook: Noncontact Atomic Force Microscopy; S. Morita,R. Wiesendanger,E. Meyer Book 2002 Springer-Verlag Berlin Heidelberg 2002 AFM.Bias.Helium-At

SPER

Principle of NC-AFM, simple and grants an instructive appreciation of the concepts of atomic-scale imaging. The AFM is somewhat more complicated and the additional challenges faced by AFM show up clearly in a direct comparison. We therefore start with a brief review of STM. The STM is covered in depth in many excellent books and review articles, e.g., [.,.,.,.,.,.].

strdulate

Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces,mpositional and structural inhomogeneity of oxide surfaces makes it extremely difficult to identify the essential issues for their functions. Scanning probe microscopy (SPM) has particularly great potential for overcoming the difficulty of heterogeneity, by discriminating specific sites from the other sites on an atomic scale.

Pcos971

Analysis of Microscopy and Spectroscopy Experiments,tation was overcome in 1995 by the implementation of the so-called non-contact mode of AFM [.,.]. This setup uses a specific detection scheme of the dynamic force microscope (DFM) in ultra-high vacuum (UHV) [.].

帶來(lái)的感覺

instructive

Foolproof

Atomic Resolution Imaging on Fluorides,ography optics requires materials with structural perfection and utmost purity of bulk and surface. In this context, high resolution and sensitivity imaging on fluorides for structural characterization and surface defect detection has become an important issue and is a major driving force behind further development.

豪華

Organic Molecular Films,able features of organic molecules is that each molecule shows characteristic electrical and/or optical properties which are extremely sensitive to its molecular structure and conformation. This allows us to design a wide variety of functional devices.

禮節(jié)

chalice

Chemical Interaction in NC-AFM on Semiconductor Surfaces, mode the tip oscillates at its eigenfrequency . and moves in and out of the interaction region during each oscillation cycle. Due to the tip—surface interaction the new eigenfrequency is modified by Δ. from the original eigenfrequency ... Experimentally, by keeping Δ. constant with feedback systems, we can obtain a NC-AFM image.

MUMP