書目名稱 | Noncontact Atomic Force Microscopy |
副標(biāo)題 | Volume 3 |
編輯 | Seizo Morita,Franz J. Giessibl,Roland Wiesendanger |
視頻video | http://file.papertrans.cn/668/667212/667212.mp4 |
概述 | Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy.Deals with the various classes of materials studied at the atomic scale.A valuable refer |
叢書名稱 | NanoScience and Technology |
圖書封面 |  |
描述 | .This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved |
出版日期 | Book 2015 |
關(guān)鍵詞 | Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical S |
版次 | 1 |
doi | https://doi.org/10.1007/978-3-319-15588-3 |
isbn_softcover | 978-3-319-35876-5 |
isbn_ebook | 978-3-319-15588-3Series ISSN 1434-4904 Series E-ISSN 2197-7127 |
issn_series | 1434-4904 |
copyright | Springer International Publishing Switzerland 2015 |