| 書(shū)目名稱 | Noncontact Atomic Force Microscopy |
| 副標(biāo)題 | Volume 2 |
| 編輯 | Seizo Morita,Franz J. Giessibl,Roland Wiesendanger |
| 視頻video | http://file.papertrans.cn/668/667211/667211.mp4 |
| 概述 | Most advanced state-of-the-art report on scanning probe microscopy.Presents the latest developments in STM and AFM.Deals with the various classes of materials studied.A valuable reference work for res |
| 叢書(shū)名稱 | NanoScience and Technology |
| 圖書(shū)封面 |  |
| 描述 | .Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.. |
| 出版日期 | Book 2009 |
| 關(guān)鍵詞 | Atomic and molecular imaging; Atomic scale magnetic imaging; Chemical identification; Force spectroscop |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-01495-6 |
| isbn_softcover | 978-3-642-26070-4 |
| isbn_ebook | 978-3-642-01495-6Series ISSN 1434-4904 Series E-ISSN 2197-7127 |
| issn_series | 1434-4904 |
| copyright | Springer-Verlag Berlin Heidelberg 2009 |
|Archiver|手機(jī)版|小黑屋|
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