| 書目名稱 | Noise Contamination in Nanoscale VLSI Circuits |
| 編輯 | Selahattin Sayil |
| 視頻video | http://file.papertrans.cn/667/666770/666770.mp4 |
| 概述 | Offers comprehensive, textbook coverage of all major noise mechanisms affecting nanometer VLSI circuits.Covers power supply noise in on-chip power and ground distribution networks and its impact on ci |
| 叢書名稱 | Synthesis Lectures on Digital Circuits & Systems |
| 圖書封面 |  |
| 描述 | This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated?circuits. The?author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental?Coverages?also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.. |
| 出版日期 | Textbook 2022 |
| 關鍵詞 | CMOS Design & Reliability textbook; VLSI Design for Reliability textbook; VLSI Noise textbook; Intercon |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-031-12751-9 |
| isbn_softcover | 978-3-031-12753-3 |
| isbn_ebook | 978-3-031-12751-9Series ISSN 1932-3166 Series E-ISSN 1932-3174 |
| issn_series | 1932-3166 |
| copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl |
|Archiver|手機版|小黑屋|
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