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Titlebook: New Methods of Concurrent Checking; Michael G?essel,Vitaly Ocheretny,Daniel Marienfeld Book 2008 Springer Science+Business Media B.V. 2008

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發(fā)表于 2025-3-21 18:19:50 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱New Methods of Concurrent Checking
編輯Michael G?essel,Vitaly Ocheretny,Daniel Marienfeld
視頻videohttp://file.papertrans.cn/666/665484/665484.mp4
概述Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults.Shows in a systematic way how the best possible state-of-the-art digital error detection circuit
叢書名稱Frontiers in Electronic Testing
圖書封面Titlebook: New Methods of Concurrent Checking;  Michael G?essel,Vitaly Ocheretny,Daniel Marienfeld Book 2008 Springer Science+Business Media B.V. 2008
描述Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discov
出版日期Book 2008
關(guān)鍵詞CMOS; Computer; Concurrent Checking; Reliability for Nanotechnologies; Self-Checking Adders; Self-Checkin
版次1
doihttps://doi.org/10.1007/978-1-4020-8420-1
isbn_softcover978-90-481-7876-6
isbn_ebook978-1-4020-8420-1Series ISSN 0929-1296
issn_series 0929-1296
copyrightSpringer Science+Business Media B.V. 2008
The information of publication is updating

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Book 2008l patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transis
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Michael G?essel,Vitaly Ocheretny,Egor Sogomonyan,Daniel Marienfeld empirische Studie mit dem Titel "Wahrgenommener Wert von IT in Krankenh?usern" ,1 In der Skalierung von 1 = "stimme überhaupt nicht zu" bis 5 = "stimme voll zu" beantworteten 106 kaufm?nnische, 167 medizinische und 206 IT-Leiter Fragen der Studie. An dieser Stelle sei deren Einsch?tzung zu zwei The
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Michael G?essel,Vitaly Ocheretny,Egor Sogomonyan,Daniel Marienfeldkenh?usern" ,1 In der Skalierung von 1 = "stimme überhaupt nicht zu" bis 5 = "stimme voll zu" beantworteten 106 kaufm?nnische, 167 medizinische und 206 IT-Leiter Fragen der Studie. An dieser Stelle sei deren Einsch?tzung zu zwei The978-3-8348-0882-0978-3-8348-9393-2Series ISSN 2522-0578 Series E-ISSN 2522-0586
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Michael G?essel,Vitaly Ocheretny,Daniel MarienfeldOf great importance for the emerging nanotechnologies with their increasing numbers of transient faults.Shows in a systematic way how the best possible state-of-the-art digital error detection circuit
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