| 書(shū)目名稱(chēng) | New Horizons of Applied Scanning Electron Microscopy |
| 編輯 | Kenichi Shimizu,Tomoaki Mitani |
| 視頻video | http://file.papertrans.cn/666/665368/665368.mp4 |
| 概述 | Presents a new technique to significantly improve in resolution and extent the applicational field of scanning electron microscopy.Covers physics, sample preparation and technical aspects.Offers many |
| 叢書(shū)名稱(chēng) | Springer Series in Surface Sciences |
| 圖書(shū)封面 |  |
| 描述 | .In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.. |
| 出版日期 | Book 2010 |
| 關(guān)鍵詞 | High-resolution SEM; Metals and their structures; SEM sample preparation; Sample surface preparation; Sc |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-03160-1 |
| isbn_softcover | 978-3-642-26168-8 |
| isbn_ebook | 978-3-642-03160-1Series ISSN 0931-5195 Series E-ISSN 2198-4743 |
| issn_series | 0931-5195 |
| copyright | Springer-Verlag Berlin Heidelberg 2010 |
|Archiver|手機(jī)版|小黑屋|
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