書目名稱 | Nanoscale Probes of the Solid/Liquid Interface | 編輯 | Andrew A. Gewirth,Hans Siegenthaler | 視頻video | http://file.papertrans.cn/661/660950/660950.mp4 | 叢書名稱 | NATO Science Series E: | 圖書封面 |  | 描述 | .Nanoscale Probes of the Solid--Liquid Interface. dealswith the use of the scanning tunnelling microscope (STM) and relatedinstrumentation to examine the phenomena occurring at the interfacebetween solid and liquid. .Scanning probe microscopy (the collective term for such instruments asthe STM, the atomic force microscope and related instrumentation)allows detailed, real space atomic or lattice scale insight intosurface structures, information which is ideally correlated withsurface reactivity. The use of SPM methods is not restricted toultrahigh vacuum: the STM and AFM have been used on samples immersedin solution or in ambient air, thus permitting a study ofenvironmental effects on surfaces. At the solid--liquid interface thereactivity derives precisely from the presence of the solution and, inmany cases, the application of an external potential. .Topics covered in the present volume include: the advantages ofstudying the solid--liquid interface and the obtaining of additionalinformation from probe measurements; interrelationships between probetip, the interface and the tunnelling process; STM measurements onsemiconductor surfaces; the scanning electrochemical microscope, AFMand | 出版日期 | Book 1995 | 關(guān)鍵詞 | AFM; STM; control; electrochemistry; measurement; metal | 版次 | 1 | doi | https://doi.org/10.1007/978-94-015-8435-7 | isbn_softcover | 978-90-481-4541-6 | isbn_ebook | 978-94-015-8435-7Series ISSN 0168-132X | issn_series | 0168-132X | copyright | Springer Science+Business Media Dordrecht 1995 |
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