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Titlebook: Nanoscale Memory Repair; Masashi Horiguchi,Kiyoo Itoh Book 2011 Springer Science+Business Media, LLC 2011 Embedded Systems.Integrated Circ

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書目名稱Nanoscale Memory Repair
編輯Masashi Horiguchi,Kiyoo Itoh
視頻videohttp://file.papertrans.cn/661/660943/660943.mp4
概述Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories.Covers both the mathematical foundations and engineering applications of yield and reliability i
叢書名稱Integrated Circuits and Systems
圖書封面Titlebook: Nanoscale Memory Repair;  Masashi Horiguchi,Kiyoo Itoh Book 2011 Springer Science+Business Media, LLC 2011 Embedded Systems.Integrated Circ
描述Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
出版日期Book 2011
關(guān)鍵詞Embedded Systems; Integrated Circuit Design; Memory Reliability and Repair; Nanoscale Memory; Soft Error
版次1
doihttps://doi.org/10.1007/978-1-4419-7958-2
isbn_softcover978-1-4614-2794-0
isbn_ebook978-1-4419-7958-2Series ISSN 1558-9412 Series E-ISSN 1558-9420
issn_series 1558-9412
copyrightSpringer Science+Business Media, LLC 2011
The information of publication is updating

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Masashi Horiguchi,Kiyoo Itohhe book are the “pyramids” of Xi’an from the Han dynasty, the mountain tombs of the Tang dynasty, and the Ming and Qing imperial tombs. The book explains how considerations such as astronomical orientation and topographical orientation according to the principles of Feng Shui played a fundamental ro
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978-1-4614-2794-0Springer Science+Business Media, LLC 2011
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Integrated Circuits and Systemshttp://image.papertrans.cn/n/image/660943.jpg
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https://doi.org/10.1007/978-1-4419-7958-2Embedded Systems; Integrated Circuit Design; Memory Reliability and Repair; Nanoscale Memory; Soft Error
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