| 書目名稱 | Models in Hardware Testing |
| 副標題 | Lecture Notes of the |
| 編輯 | Hans-Joachim Wunderlich |
| 視頻video | http://file.papertrans.cn/637/636786/636786.mp4 |
| 概述 | Introduction of model based hardware testing.Describes fault models for nanoscaled CMOS technology.Fault simulation, ATPG and diagnosis algorithms for complex fault models.Comprehensive treatment incl |
| 叢書名稱 | Frontiers in Electronic Testing |
| 圖書封面 |  |
| 描述 | .Model based testing is the most powerful technique for testing hardware and software systems. .Models in Hardware Testing. describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.. |
| 出版日期 | Book 2010 |
| 關鍵詞 | Automat; CMOS; Hardware; algorithms; logic; model; modeling; simulation |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-90-481-3282-9 |
| isbn_softcover | 978-94-007-3093-9 |
| isbn_ebook | 978-90-481-3282-9Series ISSN 0929-1296 |
| issn_series | 0929-1296 |
| copyright | Springer Science+Business Media B.V. 2010 |
|Archiver|手機版|小黑屋|
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