| 書目名稱 | Modeling Nanoscale Imaging in Electron Microscopy |
| 編輯 | Thomas Vogt,Wolfgang Dahmen,Peter Binev |
| 視頻video | http://file.papertrans.cn/637/636033/636033.mp4 |
| 概述 | Focuses solely on the modeling of microscopy, not the instrumentation.First book in the field since 1998.Includes supplementary material: |
| 叢書名稱 | Nanostructure Science and Technology |
| 圖書封面 |  |
| 描述 | .Modeling Nanoscale Imaging in Electron Microscopy. presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. . |
| 出版日期 | Book 2012 |
| 關(guān)鍵詞 | Analysis; Dahmen; Electron; Imaging; Microscopy; Modeling; Nanoscale; Resolution; STEM; TEM; Vogt |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4614-2191-7 |
| isbn_softcover | 978-1-4899-9728-9 |
| isbn_ebook | 978-1-4614-2191-7Series ISSN 1571-5744 Series E-ISSN 2197-7976 |
| issn_series | 1571-5744 |
| copyright | Springer Science+Business Media, LLC 2012 |
|Archiver|手機版|小黑屋|
派博傳思國際
( 京公網(wǎng)安備110108008328)
GMT+8, 2025-10-23 06:28
發(fā)表于 2025-3-21 18:18:51
