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Titlebook: Microstructural Characterisation Techniques; Gunturi Venkata Sitarama Sastry Textbook 2022 The Editor(s) (if applicable) and The Author(s)

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發(fā)表于 2025-3-21 19:56:50 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Microstructural Characterisation Techniques
編輯Gunturi Venkata Sitarama Sastry
視頻videohttp://file.papertrans.cn/634/633504/633504.mp4
概述Discusses Fourier analysis and Fourier transformation, electron diffraction, and electromagnetic waves.Includes pedagogical features such as end-of-chapter exercises and worked examples.Is useful guid
叢書名稱Indian Institute of Metals Series
圖書封面Titlebook: Microstructural Characterisation Techniques;  Gunturi Venkata Sitarama Sastry Textbook 2022 The Editor(s) (if applicable) and The Author(s)
描述.This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization. .
出版日期Textbook 2022
關(guān)鍵詞Metallography; Indexing of Electron Diffraction Patterns; Optical Microscopy; Transmission Electron Mic
版次1
doihttps://doi.org/10.1007/978-981-19-3509-1
isbn_softcover978-981-19-3511-4
isbn_ebook978-981-19-3509-1Series ISSN 2509-6400 Series E-ISSN 2509-6419
issn_series 2509-6400
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor
The information of publication is updating

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沙發(fā)
發(fā)表于 2025-3-21 22:09:46 | 只看該作者
Microstructural Characterisation Techniques978-981-19-3509-1Series ISSN 2509-6400 Series E-ISSN 2509-6419
板凳
發(fā)表于 2025-3-22 02:55:30 | 只看該作者
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發(fā)表于 2025-3-22 04:32:58 | 只看該作者
Gunturi Venkata Sitarama SastryDiscusses Fourier analysis and Fourier transformation, electron diffraction, and electromagnetic waves.Includes pedagogical features such as end-of-chapter exercises and worked examples.Is useful guid
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發(fā)表于 2025-3-22 08:46:38 | 只看該作者
Indian Institute of Metals Serieshttp://image.papertrans.cn/m/image/633504.jpg
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發(fā)表于 2025-3-22 15:35:47 | 只看該作者
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發(fā)表于 2025-3-22 21:22:54 | 只看該作者
,Fourier Analysis and?Fourier Transformation,A superposition of cosine and sine functions with chosen frequencies and phase relationships can represent any periodic or non-periodic function conforming to the shape of a regular body. This was proposed by Fourier, though in some form it was already being used. The study of decomposition of such functions is termed as Fourier analysis.
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發(fā)表于 2025-3-23 01:59:56 | 只看該作者
Introduction,rphology or material behaviour can be understood by characterisation techniques other than visual observation of the microstructure. Perhaps this tendency is related to the innate desire of human mind to always visualise or picturise a concept. Nevertheless, when we consider heterogeneous materials,
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發(fā)表于 2025-3-23 07:36:23 | 只看該作者
Transmission Electron Microscope, (ii) image forming system and (iii) viewing and recording system. These are elaborated sequentially in later sections. We will elaborate on the source of electrons, i.e. the electron gun, their different types and the condenser lens system with associated apertures under ‘illumination system’.
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