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Titlebook: Microelectronics, Circuits and Systems; Select Proceedings o Abhijit Biswas,Raghvendra Saxena,Debashis De Conference proceedings 2021 The E

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發(fā)表于 2025-3-21 19:34:39 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Microelectronics, Circuits and Systems
副標(biāo)題Select Proceedings o
編輯Abhijit Biswas,Raghvendra Saxena,Debashis De
視頻videohttp://file.papertrans.cn/634/633217/633217.mp4
概述Focuses on emerging research topics of electronics, microelectronics, electrical, and computer engineering.Offers a valuable reference guide for researchers and practitioners.Highlights various applic
叢書名稱Lecture Notes in Electrical Engineering
圖書封面Titlebook: Microelectronics, Circuits and Systems; Select Proceedings o Abhijit Biswas,Raghvendra Saxena,Debashis De Conference proceedings 2021 The E
描述.This book presents a collection of peer-reviewed articles from the 7th International Conference on Microelectronics, Circuits, and Systems – Micro 2020. The volume covers the latest development and emerging research topics of material sciences, devices, microelectronics, circuits, nanotechnology, system design and testing, simulation, sensors, photovoltaics, optoelectronics, and its different applications. This book also deals with several tools and techniques to match the theme of the conference. It will be a valuable resource for researchers, professionals, Ph.D. scholars, undergraduate and postgraduate students working in Electronics, Microelectronics, Electrical, and Computer Engineering..
出版日期Conference proceedings 2021
關(guān)鍵詞Nano-structures and Nanomaterials; Silicon and III-V Technology; CMOS Scaling Issues; Photolithography
版次1
doihttps://doi.org/10.1007/978-981-16-1570-2
isbn_softcover978-981-16-1572-6
isbn_ebook978-981-16-1570-2Series ISSN 1876-1100 Series E-ISSN 1876-1119
issn_series 1876-1100
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor
The information of publication is updating

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發(fā)表于 2025-3-21 23:32:05 | 只看該作者
Impact of Channel Epilayer Induced Corner-Effect on the Sensing Performance of a Unique PTFET-Based esence of a corner due to the introduced epilayer, actually, comes to the aid of the proposed epi-pTFET-biosensor device by enhancing its detectability, compared to its equivalent conventional SOI pTFET sensor device by a great degree, yet maintaining significantly good sensitivity matrices throughout.
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Conference proceedings 2021 and techniques to match the theme of the conference. It will be a valuable resource for researchers, professionals, Ph.D. scholars, undergraduate and postgraduate students working in Electronics, Microelectronics, Electrical, and Computer Engineering..
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發(fā)表于 2025-3-22 10:38:26 | 只看該作者
1876-1100 for researchers and practitioners.Highlights various applic.This book presents a collection of peer-reviewed articles from the 7th International Conference on Microelectronics, Circuits, and Systems – Micro 2020. The volume covers the latest development and emerging research topics of material scie
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發(fā)表于 2025-3-22 13:01:45 | 只看該作者
Superior Performance of Gate Workfunction and Gate Dielectric Engineered Trapezoidal FinFET in the Peen solved by employing suitable boundary conditions. It is demonstrated that the device offers improved reliability in presence of trap charges and exhibits excellent immunity to short channel effects.
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發(fā)表于 2025-3-22 17:45:47 | 只看該作者
Unified Analytical Model for Charge Density and Plasmonic Waves in the Quaternary AlInGaN/AlN/GaN He accumulation in quaternary alloys, as compared to ternary alloys such as AlGaN, the introduced plasmon oscillations have a higher frequency by almost an order. Our model gives an insight into exploring the quaternary alloy-based HEMTs for future THz applications.
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