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Titlebook: Metrology; Wei Gao Living reference work 20200th edition Process Control.Precision Length Sensors.Precision Angle Sensors.Surface Finish

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樓主: 不能平庸
31#
發(fā)表于 2025-3-26 22:35:21 | 只看該作者
Machine Tool Prognosis for Precision Manufacturing, advancement of precision manufacturing technologies. As the precision and quality of manufactured parts are significantly affected by the performance of the machine tools, accurate and reliable condition monitoring, performance prediction, and maintenance of machine tools become one important part
32#
發(fā)表于 2025-3-27 04:49:25 | 只看該作者
33#
發(fā)表于 2025-3-27 07:30:53 | 只看該作者
High-Speed Measurement of Complex Shaped Parts by Laser Triangulation for In-line Inspection,mances of a product. Geometrical deviations in manufacturing can cause waste of large quantities of energy. Testing of parts having freeform surfaces is a key activity during the development of products with better performances. Depending on the workpiece shape, its manufacturing process, and tolera
34#
發(fā)表于 2025-3-27 13:02:11 | 只看該作者
Micro-dimensional Measurement by a Micro-probing System,n tools. In especial, the tactile micro-probes are one of the most effective micro-probing systems since the miniaturized micro-stylus and high-sensitive probing sensor of the micro-probing systems allows both the capability of three-dimensional accessibility and nanometric resolution for the comple
35#
發(fā)表于 2025-3-27 13:45:05 | 只看該作者
Measurements in Additive Manufacturing, component assemblies can be manufactured and not least how to ensure that manufacturing quality is met. This chapter is an enchiridion that details the most commonly applied AM technologies, their existing standards, and what measurements and quality assurance methods that are most relevant for eac
36#
發(fā)表于 2025-3-27 19:29:23 | 只看該作者
37#
發(fā)表于 2025-3-27 23:08:28 | 只看該作者
38#
發(fā)表于 2025-3-28 05:30:45 | 只看該作者
39#
發(fā)表于 2025-3-28 07:55:35 | 只看該作者
Contact-Type Micro Thermal Sensor for Surface Defect Detection,ed surfaces such as bare semiconductor wafers, magnetic disks, and optical components, is important process to assure the quality of products. In this chapter, a surface defect detection method, in which defect detection is carried out in such a way that the existence of a surface defect on a target
40#
發(fā)表于 2025-3-28 11:23:45 | 只看該作者
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