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Titlebook: Measurement of Residual and Applied Stress Using Neutron Diffraction; Michael T. Hutchings (Director),Aaron D. Krawitz ( Book 1992 Springe

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書目名稱Measurement of Residual and Applied Stress Using Neutron Diffraction
編輯Michael T. Hutchings (Director),Aaron D. Krawitz (
視頻videohttp://file.papertrans.cn/629/628121/628121.mp4
叢書名稱NATO Science Series E:
圖書封面Titlebook: Measurement of Residual and Applied Stress Using Neutron Diffraction;  Michael T. Hutchings (Director),Aaron D. Krawitz ( Book 1992 Springe
描述The accurate, absolute, and non-destructive measurement of residual stress fields within metallic, ceramic, and composite engineering components has been one of the major problems facing engineers for many years, and so the extension of X-ray methods to the use of neutrons represents a major advance. The technique utilizes the unique penetrating power of the neutron into most engineering materials, combined with the sensitivity of diffraction, to measure the separation of lattice planes within grains of polycrystalline engineering materials, thus providing an internal strain gauge. The strain is then converted to stress using calibrated elastic constants. It was just over ten years ago that the initial neutron diffraction measurements of residual stress were carried out, and during the ensuing decade measurements have commenced at most steady state reactors and pulsed sources around the world. So swift has been the development of the field that, in addition to fundamental scientific studies, commercial measurements have been made on industrial components for several years now. The use of neutrons is ideally suited to the determination of triaxial macrostress tensors, macrostress gr
出版日期Book 1992
關(guān)鍵詞Metall; X-Ray; alloy; composite; diffraction
版次1
doihttps://doi.org/10.1007/978-94-011-2797-4
isbn_softcover978-94-010-5242-9
isbn_ebook978-94-011-2797-4Series ISSN 0168-132X
issn_series 0168-132X
copyrightSpringer Science+Business Media Dordrecht 1992
The information of publication is updating

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Application of X-Ray Residual Stress Measurements in Industrial R&Dial circumstances. This is made possible by the recent development of commercial portable equipment having appropriate software to acquire the raw data, calculate the measured stress and provide an estimate of the precision based on counting statistics, regression analysis and fluctuations in peak i
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Macrostresses, Microstresses and Stress Tensorssses) according to the length scale over which they are nearly constant in magnitude and direction. Diffraction methods are sensitive to all three kinds of residual stresses, thus giving more detailed information on the stress state of a material than any other technique. On the other hand, this com
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Separation of Microstresses and Macrostresseshase. The stress equilibrium relations allowing this separation are outlined. It is shown that errors in the unstressed lattice parameter lead to errors in only the hydrostatic component of the stress tensor. It is thus possible to accurately determine the entire deviatoric macrostress and microstre
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The Effects of Crystalline Anisotropy on the Elastic Response of Materialsdiffraction and a rig giving a controlled stress are described. These are able to measure the strain as a function of the stress for a number of crystallographic planes. The anisotropy effects predicted be the simple Reuss and Voigt theories will be described. Recent measurements on initially stress
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Investigation of Large Grained Samples — Principlesrom the experimental strain data. Therefore an evaluation of the crystallite under study is necessary. The procedure for establishing the orientation matrix from two observed reflections is described. Using a four-circle-diffractometer the knowledge of the orientation matrix then allows the calculat
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