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Titlebook: Mathematical Foundations of System Safety Engineering; A Road Map for the F Richard R. Zito Textbook 2020 Springer Nature Switzerland AG 20

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發(fā)表于 2025-3-21 16:16:03 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Mathematical Foundations of System Safety Engineering
副標(biāo)題A Road Map for the F
編輯Richard R. Zito
視頻videohttp://file.papertrans.cn/627/626169/626169.mp4
概述Explains systematic mathematical procedures for detecting and correcting latent system flaws.Positions system safety engineering (SSE) as an early design-phase function rather than an afterthought.Tre
圖書(shū)封面Titlebook: Mathematical Foundations of System Safety Engineering; A Road Map for the F Richard R. Zito Textbook 2020 Springer Nature Switzerland AG 20
描述This graduate-level textbook elucidates low-risk and fail-safe systems in mathematical detail.? It addresses, in particular, problems where mission-critical performance is paramount, such as in aircraft, missiles, nuclear reactors and weapons, submarines, and many other types of systems where “failure” can result in overwhelming loss of life and property. The book is divided into four parts: Fundamentals, Electronics, Software, and Dangerous Goods. The first part on Fundamentals addresses general concepts of system safety engineering that are applicable to any type of system.? The second part, Electronics, addresses the detection and correction of electronic hazards.? In particular, the Bent Pin Problem, Sneak Circuit Problem, and related electrical problems are discussed with mathematical precision.? The third part on Software addresses predicting software failure rates as well as detecting and correcting deep software logical flaws (called defects).? Thefourth part on Dangerous Goods presents solutions to three typical industrial chemical problems faced by the system safety engineer during the design, storage, and disposal phases of a dangerous goods’ life cycle..?.
出版日期Textbook 2020
關(guān)鍵詞System Safety Engineering; life cycle of materials; System Safety in Electronics, Software, and Danger
版次1
doihttps://doi.org/10.1007/978-3-030-26241-9
isbn_softcover978-3-030-26243-3
isbn_ebook978-3-030-26241-9
copyrightSpringer Nature Switzerland AG 2020
The information of publication is updating

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The Bent Pin Problem—III: Number Theory Methods probability between any two pins. In this chapter, the third about bent pins, the enumeration of “simple” short circuit paths (without loops or switchbacks) between any two pins, and of any length, is described.
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The Bent Pin Problem—IV: Limit Methodsgence, and truncation properties of the probability series used to compute the total short-circuit probability P. for a theoretical connector having an infinite number of pins. The results of these calculations are then applied to real finite connectors.
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The Bent Pin Problem—V: Experimental Methodse all bent pin calculation. The single pin contact probability will then be used to compute the probability of forming two sample paths. Solutions will be given for both thin and thick pin connector arrays. Finally, Foreign Objects and Debris in connectors will be addressed, and their contribution to the short-circuit probability calculated.
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發(fā)表于 2025-3-22 22:16:57 | 只看該作者
Predicting Software Performancele for a more complete collection of software performance and reliability data. If a maximum in the defect rate occurs at time t?=?t. into the software development cycle, then key model selection and refinement times occur at t?=?2t. and 3t..
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Bounding the “Black Swan” Probability of multiple safety-critical failures. Ultimately, these multiple failures lead to catastrophic disruptions that are beyond the system capacity for compensation. In this chapter four Black Swan mishaps will be examined. These cases will point the way to the proper bounding of Black Swan probabilities.
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