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Titlebook: Material Characterization Using Ion Beams; J. P. Thomas,A. Cachard Book 1978 Springer Science+Business Media New York 1978 Pet.Plantation.

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書目名稱Material Characterization Using Ion Beams
編輯J. P. Thomas,A. Cachard
視頻videohttp://file.papertrans.cn/626/625649/625649.mp4
叢書名稱NATO Science Series B:
圖書封面Titlebook: Material Characterization Using Ion Beams;  J. P. Thomas,A. Cachard Book 1978 Springer Science+Business Media New York 1978 Pet.Plantation.
描述The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec- tion with the others has brought a new impetus to both the funda- mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu- siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better
出版日期Book 1978
關(guān)鍵詞Pet; Plantation; atomic collision; atomic physics; chemistry; collision; development; electron; energy; mater
版次1
doihttps://doi.org/10.1007/978-1-4684-0856-0
isbn_softcover978-1-4684-0858-4
isbn_ebook978-1-4684-0856-0Series ISSN 0258-1221
issn_series 0258-1221
copyrightSpringer Science+Business Media New York 1978
The information of publication is updating

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Backscattering Analysis with MeV 4He Ions approximations are applied to the same example. Comparison of the results will help the reader decide whether to make a zero-th order approximation to get a quick answer, or make a detailed second-order analysis.
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Microanalysis by Direct Observation of Nuclear Reactionsg the target to be removed and eventually chemically treated) and is classically called activation analysis. Being by itself a detailed subject of discussions, described on the other hand, in numerous related books, this case will be not treated here.
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0258-1221 ural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity
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Fundamental Aspects of Ion Microanalysisn of the irradiated solid, they can be used for analytical purposes. Together with this analytical interest, secondary emissions, give rise to a number of fundamental problems on inelastic atomic collisions and atom-surface interactions which constitute a very active field of research at the present time.
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Backscattering of Ions with Intermediate Energiesd for .utherford .ack.cattering (RBS) analysis. It will be shown that the descriptions used for ISS as well as RBS are applicable also at energies larger or lower respectively than those normally used for these techniques.
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