Titlebook: MEMS and Nanotechnology, Volume 8; Proceedings of the 2 Barton C. Prorok,LaVern Starman,Gordon Shaw, III Conference proceedings 2015 The So

欺侮

書目名稱MEMS and Nanotechnology, Volume 8影響因子(影響力)




書目名稱MEMS and Nanotechnology, Volume 8影響因子(影響力)學(xué)科排名




書目名稱MEMS and Nanotechnology, Volume 8網(wǎng)絡(luò)公開度




書目名稱MEMS and Nanotechnology, Volume 8網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱MEMS and Nanotechnology, Volume 8被引頻次




書目名稱MEMS and Nanotechnology, Volume 8被引頻次學(xué)科排名




書目名稱MEMS and Nanotechnology, Volume 8年度引用




書目名稱MEMS and Nanotechnology, Volume 8年度引用學(xué)科排名




書目名稱MEMS and Nanotechnology, Volume 8讀者反饋




書目名稱MEMS and Nanotechnology, Volume 8讀者反饋學(xué)科排名

陰險

Barton C. Prorok,LaVern Starman,Gordon Shaw, IIIIncludes supplementary material:

音樂戲劇

Conference Proceedings of the Society for Experimental Mechanics Serieshttp://image.papertrans.cn/m/image/620124.jpg

蠟燭

978-3-319-36091-1The Society for Experimental Mechanics, Inc. 2015

我正派

MEMS and Nanotechnology, Volume 8978-3-319-07004-9Series ISSN 2191-5644 Series E-ISSN 2191-5652

Epithelium

Newly Discovered Pile Up Effects During Nanoindentation,tant to understand in order to prevent failure in nano- and microscale mechanical devices utilized in computers or cell phones. During nanoindentation tests, phenomena such as sink-in or pile-up can occur depending on the mismatch of elastic moduli and Poisson’s ratios. This, in turn, alters the pro

–FER

intention

delegate

Bonded Hemishell Approach to Encapsulate Microdevices in Spheroidal Packages,ropic etching methods were utilized to produce hemispherical cavities in silicon wafers. sulfur hexafluoride (SF.) based plasma was determined to be a preferable alternative to wet HNA etching when performing repeatable isotropic etches in silicon. Silicon crystal orientation’s effect on etch varian

languid

Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array,bi-material structures that deflect linearly as a function of temperature associated with infrared radiation from a scene. An optical readout system can be used to measure the deformation of the structures based on reflected light, and offers several advantages over the microbolometer sensors that a