| 書目名稱 | Low-Frequency Noise in Advanced MOS Devices |
| 編輯 | Martin von Haartman,Mikael ?stling |
| 視頻video | http://file.papertrans.cn/589/588871/588871.mp4 |
| 概述 | Bridges between noise theory and modelling, characterization, CMOS technology and circuits.Modern with the latest advances in CMOS technology.Low-frequency noise in CMOS devices is examined, discussed |
| 叢書名稱 | Analog Circuits and Signal Processing |
| 圖書封面 |  |
| 描述 | .Low-Frequency Noise in Advanced CMOS Devices. begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits. . |
| 出版日期 | Book 2007 |
| 關鍵詞 | 1/f noise; CMOS; CMOS technology; Leistungsfeldeffekttransistor; MOSFETs; Transistor; analog circuits; fiel |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4020-5910-0 |
| isbn_softcover | 978-90-481-7472-0 |
| isbn_ebook | 978-1-4020-5910-0Series ISSN 1872-082X Series E-ISSN 2197-1854 |
| issn_series | 1872-082X |
| copyright | Springer Science+Business Media B.V. 2007 |
|Archiver|手機版|小黑屋|
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