Titlebook: Light Scattering from Microstructures; Lectures of the Summ Fernando Moreno,Francisco González Conference proceedings 2000 Springer-Verlag

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Introduction to Light Scattering from Microstructureselength, scattered radiation can be detected in all directions. Furthermore, the electromagnetic characteristics of the scattered wave in a given direction may be changed due to the interaction of the incident radiation with the microstructure. This constitutes an important electromagnetic problem s

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Mathematical Methods for Data Inversionence and technology. Problems of this type introduce some loss of information between what we may call a generalised “object” and its “image” under the linear mapping. This loss of information often makes the attempted inversion of image to object very diffcult. In practice the image is usually a di

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Mueller Matricesysis of this information is not a simple matter because of the complicated relationships between the elements of these matrices. This chapter deals with the properties of Mueller matrices and with the analysis of physical parameters measurable by polarimetric techniques. First, the case of scatterin

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