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Titlebook: Laser Measurement Technology; Fundamentals and App Axel Donges,Reinhard Noll Book 2015 Springer-Verlag Berlin Heidelberg 2015 Holografic In

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書目名稱Laser Measurement Technology
副標題Fundamentals and App
編輯Axel Donges,Reinhard Noll
視頻videohttp://file.papertrans.cn/582/581532/581532.mp4
概述Includes a total up-to-date survey of the most important laser measurement technologies.Enables the reader to plan, carry out and analyze measurements.Provides an overview of the applications of laser
叢書名稱Springer Series in Optical Sciences
圖書封面Titlebook: Laser Measurement Technology; Fundamentals and App Axel Donges,Reinhard Noll Book 2015 Springer-Verlag Berlin Heidelberg 2015 Holografic In
描述.Laser measurement technology has evolved in the last years in a versatile and reflationary way. Today, its methods are indispensable for research and development activities as well as for production technology. Every physicist and engineer should therefore gain a working knowledge of laser measurement technology..This book closes the gap of existing textbooks. It introduces in a comprehensible presentation laser measurement technology in all its aspects. Numerous figures, graphs and tables allow for a fast access into the matter. In the first part of the book the important physical and optical basics are described being necessary to understand laser measurement technology. In the second part technically significant measuring methods are explained and application examples are presented..Target groups of this textbook are students of natural and engineering sciences as well as working physicists and engineers, who are interested to make themselves familiar with laser measurement technology and its fascinating potentials..
出版日期Book 2015
關鍵詞Holografic Interferometry; Inline Process Control; Laser Beam Shaping and Guiding; Laser Doppler Method
版次1
doihttps://doi.org/10.1007/978-3-662-43634-9
isbn_softcover978-3-662-52358-2
isbn_ebook978-3-662-43634-9Series ISSN 0342-4111 Series E-ISSN 1556-1534
issn_series 0342-4111
copyrightSpringer-Verlag Berlin Heidelberg 2015
The information of publication is updating

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Detection of Electromagnetic Radiation,detectors, semiconductor detectors, space-resolving detectors. This is followed by the discussion of some general principles of electronic metrology, which must be considered when applying these detectors. Finally, we compare and summarize the properties of the discussed detectors.
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Laser Interferometry,erometer. This discussion also includes angular and straightness measurements. Finally, the Twyman-Green interferometer is presented, which can be used for testing the quality of optical imaging components.
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Holographic Interferometry,allows to make visible slight changes of the object shape as those induced by deformations or vibrations. The quantitative determination of the displacement vector with the help of the phase-shifting method is explained. We present the fundamentals of digital holography and digital holographic inter
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Speckle Metrology,sure out-of-plane, in-plane or derivatives of object displacements. The set-up of an electronic speckle interferometer is shown and examples of applications are given ranging from deformation analysis of stressed mechanical components, the detection of internal flaws in foam parts or tires to the an
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