| 書目名稱 | Kelvin Probe Force Microscopy |
| 副標題 | From Single Charge D |
| 編輯 | Sascha Sadewasser,Thilo Glatzel |
| 視頻video | http://file.papertrans.cn/543/542372/542372.mp4 |
| 概述 | Discusses the applications of Kelvin probe force microscopy in nanotechnology.Provides a detailed description of a variety of theoretical and experimental aspects of the technique.Includes contributio |
| 叢書名稱 | Springer Series in Surface Sciences |
| 圖書封面 |  |
| 描述 | .This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics..In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics..It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.. |
| 出版日期 | Book 2018 |
| 關鍵詞 | Scanning Kelvin Probe Microscopy; Electrostatic Force Microscopy; KPFM techniques for liquid environme |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-75687-5 |
| isbn_softcover | 978-3-030-09298-6 |
| isbn_ebook | 978-3-319-75687-5Series ISSN 0931-5195 Series E-ISSN 2198-4743 |
| issn_series | 0931-5195 |
| copyright | Springer International Publishing AG, part of Springer Nature 2018 |
|Archiver|手機版|小黑屋|
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